Test program set obsolescence mitigation through software and automatic test equipment system processes

ABSTRACT

Electronic test system including hardware and software components and method of use of same which provide obsolescence mitigation. A set of governing rules for the system is defined and a test program test (TPS) is created to enable units to be tested. When a new component is introduced into the system, the change is detected and a new TPS is created. If the new TPS complies with the rules, testing using the new TPS is possible. If not, a determination is made as to whether any component of the TPS is obsolete and if not, the units can be tested using the new TPS without redefining the rules. When a component of the TPS is obsolete, the rules are reviewed to ascertain the effect of the removal of the component and optionally redefined to enable the new component to be used in combination with the remaining components.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority under 35 U.S.C. §119(e) of U.S.provisional patent application Ser. No. 60/643,248 filed Jan. 12, 2005,now expired, which is incorporated by reference herein.

FIELD OF THE INVENTION

The present invention relates generally to methods and systems forobsolescence mitigation of electronic systems including hardware andsoftware components and more particularly to methods and systems fordealing with obsolete hardware and software in automated test systems toenable transparent updating of the automated test systems andapplications.

The present invention also relates generally to methods and systems forperforming production, functional and diagnostic tests using automatedtest systems and subsystems to enable subsequent repair to serviceablestatus of the systems and subsystems, or to certify functional readinessof the systems and subsystems for insertion thereof into a largerfunctional assembly.

BACKGROUND OF THE INVENTION

Since the inception of automated test systems or automated testequipment, engineers have struggled with the dilemma of delivering acost effective solution to provide optimum testing of electronicequipment. Throughout the endeavor, various systems have been puttogether which have an important common system, the Test Program Set(TPS). The common system or end application includes software(application test software), hardware and documentation relating to theoperation of the hardware and software.

There have similarly been embodied in these systems a number of teststandards, test methods and philosophies, test tools and the like,developed to deliver more cost effective solutions for single andmultiple user environments. Early versions were typically companyproprietary and often, no standard existed to guide interoperability ofdifferent products. Today's solutions leverage commercial technology andstandards through the use of what is often termed open architecture.This is beneficial from the interoperability standpoint, but alone willnot likely provide a cost effective solution.

A particular problem of using commercial technology and standards is thetendency or possibility for a single entity, usually the mostdeep-pocketed entity, to influence the commercial world in their favor.This typically causes the promise of cost savings, expected to beachieved using a commercial standard, to be eroded due to significantsingle entity influence. The initiation of a commercial standard throughprofessional organizations such as the IEEE can take far too long andconsequently, a technology can be obsolete before a use standard iscomplete.

Each end application test software system is developed for and on arespective test system and follows a specified method. The system ofsoftware, hardware and documentation the end application executes on,and is therefore supported by, is most notably referral to as anAutomatic Test System (ATS). Depending on the end user, it is alsocommonly referred to as Automatic Test Equipment (ATE). For the purposeof the invention and this discussion, the term used will be GPATE, whichstands for “general purpose automatic test equipment”.

The test program set is a function embodied within both test stationsystem software which is inclusive of test integration and developmenttools and the end item application software or automatic test programsets developed and integrated which execute or run as a function of thesoftware utilizing integrated test equipment or instrumentation known asa family of testers which operates as scalable and reconfigurable GPATE.

The commercial and governmental sectors are similar competitive forcesboth fundamentally seeking cost effective GPATE solutions and theinvention delivers elements of cost effectiveness most advantageous toeach. Consider the typical governmental product life cycle andmaintenance repair cycles are far longer than those in the commercialindustry. Through this invention, the long term user benefits primarilyon the protection of the investment in test and repair capability andwill achieve a lower total cost of ownership for their extended productlife cycles. The short term user benefit is, in the near real time, theadaptabilities the invention provides through component reuse and thenatural extensibility of the system of systems.

Governmental entities exert tremendous leverage and thus directlyinfluence the commercial world of GPATE. There exists a directive forthe U.S. government to purchase DOD sponsored NxTest products orCommercial Off The Shelf (COTS) parts where available in theory becauseit is more competitive. This often causes ineffectual or outdatedcommercial standards to be prematurely introduced and inappropriatelyapplied to test systems. This is not typically done out of technicalnaivety but rather to gain a competitive edge or win points in acompetition for contracts and set up a buyer-beware type of dilemma forpurchasers. This invention alleviates the negative effects of thisphenomenon.

A second ineffectual practice is that each time a governmental entityreleases a contract it purchases similar documents and controlspertinent but not very different from previous ones. This adds short andlong term costs unnecessarily. Most importantly, it precludes thegovernmental entity from considering or establishing long termsustainment standards and practices appropriately and therefore lacksthem. This is not recognized by any entity probably due to highpersonnel turn-over in key positions.

As discussed fully below, this is achieved by the invention through theadaptation of standards and adherence to natural technology boundarieswithin the system divisions. The ultimate isolation of the work value isleast impacted when the end application software is independent of theATS. Standards are often not completely adopted by all companiesinvolved in the field in which the standard is applicable. Mostcompanies only adopt what suits their immediate needs and rarelyevaluate the long term impacts properly.

Ultimately, both the GPATE system and TPS system support the structuredtest sequences and diagnostic rational developed by the test engineer toachieve their goal. Traditionally, during this process, for each systemof the software, hardware and documentation (hereinafter referred to asa “system of subsystems”), the subsystems are fundamentally tiedtogether as a unified body of work, i.e., the “system”. In traditional,competitive systems, the body of work is not itself a system within alarger system but rather a system on top of or existing simultaneouswith a larger system.

In order to deliver the most cost effective solution in the long term,namely continuous transparent obsolescence, each unified body of workneeds to be protected from obsolescence.

Also, although it might be thought that it would be obvious to protecteach unified body of work from obsolescence, there is no known currentsystem of subsystems which provides this capability. One reason this hasnot been achieved is because system integrators are lulled away fromtheir standards by the promise of new technology or out of fear ofmissing the next best thing rather than figuring out how the next bestthing fits into what they do. Thus, when new technology is available,the “old” technology is often discarded entirely without any attempt tointegrate the new technology into the old, existing system so that atleast part of the old system might be salvaged and used further.

Accordingly, the invention seeks to adopt what is reusable and can bereplenished via multiple sources or can be duplicated in-house withinthe confines of the ATS and TPS boundaries.

OBJECTS AND SUMMARY OF THE INVENTION

It is an object of the present invention to provide new methods andsystems for obsolescence mitigation of electronic systems includinghardware and software components and more particularly to methods andsystems for dealing with obsolete hardware and software in automatedtest systems to enable transparent updating of the automated testsystems.

It is another object of the present invention to provide new methods andsystems for performing production, functional and diagnostic tests ofautomated test systems and subsystems to enable subsequent repair toserviceable status of the systems and subsystems, or to certifyfunctional readiness of the systems and subsystems for insertion thereofinto a larger functional assembly.

It is yet another object of the present invention to provide a costeffective solution to the problem which arises when only some componentswithin a system become obsolete and continued use of the system withnewer components is desired.

In order to achieve these objects and others, a method for use of anelectronic test system including hardware and software components whileproviding obsolescence mitigation comprises defining a set of governingrules for the system, creating a test program test (TPS) for the systemsuch that units under test (UUTs) can be tested using the TPS,introducing a new component into the system, detecting a change in thesystem and then creating a new TPS, determining whether the new TPScomplies with the rules and if so, enabling testing of units using thenew TPS, and when the new TPS does not comply with the rules,determining whether any component of the TPS has been rendered obsoleteand if not, enabling testing of the units using the new TPS withoutredefining the rules. When a component of the TPS has been renderedobsolete, the rules are reviewed to ascertain the effect of the removalof the component and optionally redefined to enable the new component tobe used in combination with the remaining components in the system.

Since the rules are intended to be used over the entire life cycle ofthe system, a user of the system can be notified of a violation of therules which might eliminate the transparent obsolescence mitigation.This is preferred in order to prevent a component from being introducedinto the system which would destroy the ability of the system to becontinually updated with new components while maintaining othercomponents.

The component may be a hardware or software component and may reflect anew or emerging technological innovation or standard.

An electronic test system which provides for obsolescence mitigation inaccordance with the invention includes hardware and software componentsselectively coupled together. That is, the software can be embodied onhardware components, e.g., memory components, connected to otherhardware components using conventional cabling and wirelessarrangements. The components enable creation of a test program test(TPS) for the system and testing of units using the TPS, e.g., bycoupling the unit under test (UUT) to one of the hardware componentsusing conventional cabling or wireless arrangements. The softwaredetects a change in the system caused by introduction of a new componentinto the system, in a manner known to those skilled in the art, and thenenables creation of a new TPS and determines whether the new TPScomplies with a set of governing rules for the system. The new TPS canbe created by a user of the electronic test system or automaticallybased on stored software programs. When the new TPS complies with therules, the components can initiate testing of units using the new TPS,when such units are coupled to the electronic test system. When the newTPS does not comply with the rules, the software determines whether anycomponent of the TPS has been rendered obsolete and if not, enables thecomponents to initiate testing of the units using the new TPS withoutredefining the rules. On the other hand, when a component of the TPS hasbeen rendered obsolete, the software and/or monitoring personnel can benotified in order to conduct a review of the rules to ascertain theeffect of the removal of the component. Further, the method might entailredefining the rules to enable the new component to be used incombination with the remaining components in the system. Theobsolescence mitigation technique repeats itself whenever a newcomponent is introduced into the system.

BRIEF DESCRIPTION OF THE DRAWINGS

The following drawings are illustrative of embodiments of the inventionand are not meant to limit the scope of the invention as encompassed bythe claims.

FIG. 1 is an illustration of a system of subsystems in accordance withthe invention.

FIG. 2 is a flow chart of a method in accordance with the invention.

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

Referring to the accompanying drawings wherein like reference numeralsrefer to the same or similar elements. FIG. 1 illustrates the hierarchyof a system in accordance with the invention, i.e., a system ofsubsystems 10. The system of subsystems 10 includes one or more controlsystems 12 which controls test instrument systems 14, switch systems 16and physical station interface systems 18. The physical stationinterface systems 18 are coupled to test unit interface adaptor systems20. The system of subsystems 10 contains hardware and softwarecomponents for which obsolescence mitigation is desired.

FIG. 2 shows a flow chart of one non-limiting method in accordance withthe invention for designing and maintaining a system of subsystems,namely, an automated test system comprising hardware and softwarecomponents and documentation. The method is effective on the system'shardware, software. documentation, development environments, supporttools, test program development and test program acceptance methods toachieve transparent obsolescence for the end application.

The first step (22) in the method is to establish or define a set ofgoverning rules for the system to be used over the entire life cycle ofthe system, i.e., over the entire life cycle of the automatic testsystem. These rules must be enforced throughout the use of the automatictest system in order to maintain the transparent obsolescence ability,i.e., the ability to remove, add and replace subsystems whilemaintaining the use of the remaining subsystems potentially incombination with new subsystems. If the rules are not enforced,transparent obsolescence may be precluded.

To establish effective rules, it is imperative not to overstate theimportance of common sense when developing the rules, when adoptingelements of standards, inserting new technology or replacing obsoletesubsystems.

The rules are embodied in development documents for each subsystem. Suchdevelopment documents are therefore created for each subsystem of theTPS. Fundamentally these documents define the critical interfaces andrelationships required to produce transparent obsolescence of thesystem.

Once the rules are defined, a TPS is created for the particular testsystem (24) and units can be tested (26) in a conventional manner usingthe TPS. Such use continues until such time as new technology isdeveloped which is deemed to be necessary, or desired, to use in theTPS. New technology may entail new hardware components or new software.The new subsystem is therefore inserted into the system and if anexisting subsystem has been rendered redundant, i.e., the new subsystemis intended to replace the existing subsystem and assume its function ifthe same function is still needed in the system, then the existingsubsystem is removed from the system.

Upon detection of a change in the test system (28), a new TPS is therebycreated (30). A determination is made as to whether the new TPS complieswith the defined rules (32) and if so, units can be tested using the newTPS. An example of new technology which would not require a new TPS maybe replacement of a memory unit, i.e., a memory upgrade, replacement ofa monitor, replacement of a microprocessor having a higher processingspeed, or the addition of more memory. Such changes to the TPS willgenerally not result in the need for a new TPS.

However, if the new TPS does not comply with the current rules, adetermination is made as to whether any subsystem of the TPS has beenrendered obsolete (34). If not, units can be tested using the new TPSand the rules do not need to be redefined. On the other hand, if asubsystem of the TPS has been rendered obsolete, the rules are reviewedto ascertain the effect of the removal of the subsystem and possiblyredefined to enable the new subsystem to be used in combination with theremaining subsystems (36).

Once the initial TPS has been created and used, when new/emergingtechnology (38) is developed or new/emerging standards (40) arepromulgated, an evaluation of the technology and/or standards is madeand an assessment of the advantages, disadvantages and applicability ofeach to the test system is made (42). A decision is made as to whetherpart or all of the new technology and/or standards is to be incorporatedinto the test system (44). If significant or meaningful advantages arenot provided by the technology and/or standards or if the disadvantagesoutweigh the advantages, it is determined that none of the newtechnology and/or standards is to be incorporated into the test systemand the test system is not updated, in which case the method ends. Onthe other hand, if all or part of the technology and/or standards is tobe incorporated into the test system, when the rules are reviewed forpossible redefinition (36), the technology/standards to be incorporatedis considered so that rules can accommodate test program sets using orapplying the new technology and/or standards.

In order for a new subsystem to be incorporated into the system createdby a method in accordance with the invention, it must not violate anyexisting rules and/or inherent relationships between any of thesubsystems. Without a properly designed system of subsystems and acontrolled core family of testers which adheres to the principals ofthis invention, it is currently not possible for multiple organizationsto deliver end products that can achieve transparent obsolescence.

In accordance with the invention however, the method, systems andsubsystems including logistic management are structured such thatobsolescence of any element is transparent to the end use. Thistransparency produces cost avoidance savings independent of technologyand standards employed.

Applying a method for designing and maintaining a system of subsystemsas described above, a system of subsystems can be designed whichincorporates multiple standards which mandate developmental practicesfor each subsystem within system. The method produces end products,i.e., test program sets, which are not impacted by any subsystembecoming obsolete and thus preserves the inherent value embodied in thetest program set. The test program set, or test product, is integratedhardware, software and documentation which abides by the rules andsatisfies the standards of the method.

An exemplifying test system to which the invention can be appliedincludes a computer system having interactive user interfaces andhardware or instrument interfaces. The computer system includesinteractive user interfaces including, but not limited to, a graphicaluser interface (SVGA), a text message interface (PRN), a pointingdevice/keyboard interface (PS2), a pointing device/keyboard/multimediainterface (USB), an audio interface (SB), a footswitch/instrumentcontrol bus interface (Serial Bus), several instrument control businterfaces (GPIB, MXI-2, MXI-3, MXI-4), anInternet/networking/instrument control bus (FTP) or LAN eXtension forInstrumentation (LXI), a peripheral control interface (ISA/EISA), aninstrument control bus interface (PCI or PCI Express) and a harddrive/floppy drive/DVD drive interface (IDE/EIDE), as well as thehardware components associated with these interfaces, if any. Thehardware or instrument interfaces typically include a general purposeinstrument bus (GPIB) IEEE 488.2 Standard, a VME Extension forInstrument (VXI) bus Standard, a modular measurement system (MMS) bus, aPCI bus extension for VXI version 2 (MXI-2), a PCI bus extension for VXIversion 3 (MXI-3), a file transfer protocol/Internet packet (FTP/IP), a(rewire bus IEEE Standard, a Universal Serial Bus version 2.0 (USB) anda versa Modulo Extension (VME).

While particular embodiments of the invention have been shown anddescribed, it will be obvious to those skilled in the art that changesand modifications may be made without departing from the invention inits broader aspects, and, therefore, the aim in the appended claims isto cover all such changes and modifications as fall within the truespirit and scope of the invention.

1. A method for use of an electronic test system including hardware andsoftware components while providing obsolescence mitigation, comprising:defining a set of governing rules for the system; creating, using aprocessor, at least a first test program test (TPS) for the system toenable units to be tested using the first TPS and the hardware andsoftware components of the system when such units are coupled to thesystem; storing the first TPS in memory accessible by a processor of thesystem; coupling the units to the system and testing the units using aprocessor and the hardware and software components when the units arecoupled to the system by executing the first TPS; when a new componentis sought to be introduced into the system, first determining whetherthe new component can be introduced while achieving transparentobsolescence mitigation for the first TPS and thereby enable continueduse of the first TPS in a system including the new component by:introducing the new component into the system; creating, using aprocessor, a new TPS that interacts with the new component and anyremaining components in the system without changing the remainingcomponents in the system; and determining, using a processor, whetherthe new TPS complies with the rules and if so, considering theintroduction of the new component into the system to be permissiblewhile enabling continued use of the first TPS, and if not, evaluating,using the processor, the effect of the new component on the systemincluding advantages, disadvantages and applicability of the newcomponent to the system and allowing or disallowing the introduction ofthe new component based on the evaluation; and after introduction of thecomponent into the system and creation of the new TPS, enabling testingof units using the new TPS when such units are coupled to the systemhaving the new component and any remaining components.
 2. The method ofclaim 1, wherein the rules are used over the entire life cycle of thesystem, further comprising notifying a user of the system, via a displayor user notification system, of a violation of the rules caused by theproposed introduction of a new component which might eliminate thetransparent obsolescence mitigation.
 3. The method of claim 1, furthercomprising embodying the rules in development documents for eachcomponent which define interfaces and relationships required to producetransparent obsolescence of the system, the development documents beingembodied on computer-readable storage medium.
 4. The method of claim 1,further comprises enabling introduction of the new component beingintroduced into the system into the system only when the new componentdoes not violate any existing rules and/or inherent relationshipsbetween any of the other components in the system.
 5. The method ofclaim 1, wherein the component being introduced into the system is ahardware component, and software components in the system are notchanged upon introduction of the hardware component.
 6. The method ofclaim 1, wherein the component proposed to be introduced into the systemis a software component.
 7. The method of claim 1, wherein the componentproposed to be introduced into the system reflects a new or emergingtechnological innovation.
 8. The method of claim 1, wherein thecomponent proposed to be introduced into the system reflects a new oremerging standard.
 9. The method of claim 1, further comprising, afterthe rules are reviewed to ascertain the effect of the removal of thecomponent, redefining one or more of the rules to enable the newcomponent to be used in combination with the remaining components in thesystem.
 10. The method of claim 1, further comprises enablingintroduction of the new component that is proposed to be introduced intothe system only when the new component does not violate any existingrules and/or inherent relationships between any of the other componentsin the system.
 11. The method of claim 1, further comprisingautomatically detecting a change in the system after introduction of thenew component and creating the new TPS after the change in the system isdetected.
 12. The method of claim 1, wherein when the new TPS isdetermined not to comply with the rules, determining whether anycomponent of the TPS has been rendered obsolete and if not, enablingtesting of the units using the new TPS without redefining the rules; andwhen a component of the TPS has been rendered obsolete, reviewing therules to ascertain the effect of the removal of the component.
 13. Themethod of claim 12, further comprising removing the obsolete componentfrom the system.
 14. An electronic test system which provides forobsolescence mitigation, comprising: hardware and software componentsselectively coupled together, said components including a processor andsoftware embodied on computer-readable storage medium, said componentsenabling creation of a first test program test (TPS) for the system andthen after the first TPS has been created and stored, testing of unitsusing the first TPS when such units are coupled to the system; saidsoftware being designed to detect a change in the system caused byintroduction of a new component into the system and then enable creationof a new TPS and determine whether the new TPS complies with a set ofgoverning rules for the system to enable evaluation of the continued useof the new component in the system while achieving transparentobsolescence mitigation for the first TPS and thereby enable continueduse of the first TPS in a system including the new component, the newTPS being created by said software to interact with the new componentand any remaining components in the system without changing theremaining components in the system, said hardware and softwaredetermining whether the new TPS complies with the rules and if so, theintroduction of the new component into the system is considered to bepermissible while enabling continued use of the first TPS, and if not,said hardware and software enables evaluation of the effect of the newcomponent on the system including advantages, disadvantages andapplicability of the new component to the system, the introduction ofthe new component into the system being allowed or disallowed based onthe evaluation and after introduction of the component into the systemand creation of the new TPS, enabling testing of units using the new TPSwhen such units are coupled to the system having the new component andany remaining components.
 15. The system of claim 14, wherein saidcomponents include a LAN eXtension for Instrumentation (LXI) interface.16. The system of claim 14, wherein said components include aninstrument control bus interface (PCI Express).
 17. The system of claim14, wherein said components include a NxTest product.
 18. The system ofclaim 14, wherein, after the rules are reviewed to ascertain the effectof the removal of the component, said software is designed to enable oneor more of the rules to be redefined to enable the new component to beused in combination with the remaining components in the system.
 19. Thesystem of claim 14, wherein when the new TPS is determined to complywith the rules, said components being enabled to initiate testing ofunits using the new TPS when such units are coupled to the system, andwhen the new TPS is determined not to comply with the rules, saidsoftware being designed to determine whether any component of the TPShas been rendered obsolete and if not, enable said components toinitiate testing of the units using the new TPS without redefining therules and when such units are coupled to the system, and when acomponent of the TPS has been rendered obsolete, said software beingdesigned to review the rules to ascertain the effect of the removal ofthe obsolete component.
 20. A method for use of an electronic testsystem including hardware and software components while providingtransparent obsolescence mitigation of the hardware and softwarecomponents, comprising: defining a set of governing rules for theelectronic test system; creating, using a processor, a first testprogram set comprising at least one test program test, the first testprogram set being governed by the defined rules for the electronic testsystem; configuring the electronic test system to enable a test unit tobe tested using the at least one test program test and other hardwareand software components of the electronic test system when such testunit is coupled to the electronic test system; storing the first testprogram set in a memory accessible by the electronic test system;operatively testing a plurality of test units by coupling each of thetest units to the electronic test system and then testing the test unit,when coupled to the electronic test system, using a processor and thehardware and software components by executing the at least one testprogram test; when a new component is sought to be introduced into theelectronic test system, determining whether the new component can beintroduced while achieving transparent obsolescence mitigation of thehardware and software components thereby enabling continued use of atleast part of the first test program set, including the at least onetest program test, by: introducing the new component into the electronictest system; evaluating whether the first test program set, with the newcomponent and any remaining components in the system, can comply withthe rules; and if so, creating, using a processor, a second test programset including at least part of the first test program set, including theat least one test program test, and considering the introduction of thenew component into the system to be permissible, the second test programset interacting with the new components and any remaining components inthe system without changing the remaining components in the system; orif not, reviewing and redefining the rules, and then creating, using aprocessor, a third test program set including at least part of the firsttest program test that is in compliance with the redefined rules, andconsidering the introduction of the new component into the system to bepermissible; and after introduction of the new component into theelectronic test system and creation of the second or third test programset, enabling testing of test units using the second or third testprogram set when such test units are coupled to the electronic testsystem having the new component and any remaining components.
 21. Anelectronic test system which provides for transparent obsolescencemitigation of hardware and software components of the electronic testsystem, comprising: hardware and software components selectively coupledtogether, including a memory containing a first test program setcomprising at least one test program test, said first test program setbeing governed by a set of rules for the electronic test system, saidelectronic test system being configured to enable each of a plurality oftest units to be tested using the at least one test program test andother hardware and software components of the electronic test systemwhen each such test unit is coupled to the electronic test system; andsaid hardware and software components being configured: to detect achange in the electronic test system caused by the introduction of a newcomponent into the electronic test system, and to determine whether thefirst test program set, with the new component and any remainingcomponents in the electronic test system, complies with the rules, andif so, to create a second test program set including at least part ofthe first test program set, including the at least one test programtest, and considering the introduction of the new component into thesystem to be permissible, or if not, reviewing and redefining the rules,and then creating, using a processor, a third test program set includingat least part of the first test program test that is in compliance withthe redefined rules, and considering the introduction of the newcomponent into the system to be permissible, wherein after introductionof the new component into the system and creation of the second or thirdtest program test, said hardware and software components enablingtesting of test units using the second or third test program test whensuch test units are coupled to the electronic test system having the newcomponent and any remaining components.